When: Tues., November 13, 2018
Time: 10:00AM - 1:00PM
Where:
Austin Labs
800 Paloma Dr, Suite 130.
Round Rock, TX 78665
Description:
Part 1
If you deal with jitter this seminar is for you.
Jitter is often the ultimate reason many high speed serial links fail. Analyzing the jitter between data and a reference clock is essential to find the root cause of the problem as the first step toward fixing it. Yet many of the principles of jitter are confusing or poorly understood.
In this seminar, we start at the ground floor to describe the most important and essential principle of jitter, the origin of the time interval error and how it can be used to identify sources of jitter. We start with the basic process of how it is measured and how statistical analysis can be applied to it in order to look for patterns. In particular, four jitter patterns will be uncovered and the important figures of merit for each type will be identified.
Part 2
There are only a handful of fundamental sources of jitter: periodic, DCD, ISI, random and “other”. Each of these has a different physical origin and has a different set of figures of merit by which they are described. We will explore what features in a typical high speed serial link create to each type of jitter and how to use the analysis of the TIE track to extract a few important figures of merit. We will see that depending on the properties of each type of jitter, different analysis techniques leveraging statistics, histograms and spectra apply to each type. In particular, we introduce a simplified version of Gaussian statistics to describe the figures of merit for random jitter.
Presenter: Mark Graumlich
Part 1
If you deal with jitter this seminar is for you.
Jitter is often the ultimate reason many high speed serial links fail. Analyzing the jitter between data and a reference clock is essential to find the root cause of the problem as the first step toward fixing it. Yet many of the principles of jitter are confusing or poorly understood.
In this seminar, we start at the ground floor to describe the most important and essential principle of jitter, the origin of the time interval error and how it can be used to identify sources of jitter. We start with the basic process of how it is measured and how statistical analysis can be applied to it in order to look for patterns. In particular, four jitter patterns will be uncovered and the important figures of merit for each type will be identified.
Part 2
There are only a handful of fundamental sources of jitter: periodic, DCD, ISI, random and “other”. Each of these has a different physical origin and has a different set of figures of merit by which they are described. We will explore what features in a typical high speed serial link create to each type of jitter and how to use the analysis of the TIE track to extract a few important figures of merit. We will see that depending on the properties of each type of jitter, different analysis techniques leveraging statistics, histograms and spectra apply to each type. In particular, we introduce a simplified version of Gaussian statistics to describe the figures of merit for random jitter.
Presenter: Mark Graumlich
Cost: FREE, registration is required to hold your seat.
Register for the Seminar
Seminar:
Essentials of Jitter Part 1-2
Time Interval Error & Components of Jitter
PLEASE NOTE: All visitors must provide valid government photo identification prior to gaining access to a Teledyne facility. This can be in the form of a driver's license or passport.
