When: Tues, December 11, 2018
Time: 10:00AM - 1:00PM (Includes lunch)


Where: Teledyne LeCroy Austin Labs
800 Paloma Dr., Suite 130
Round Rock, TX 78665

 

This seminar overviews basic and advanced techniques for characterizing high speed serial data channels, including crosstalk analysis, channel de-embedding, virtual probing, equalization, serial data decoding, and multi-lane testing. 

Topics include: Serial data analysis, signal integrity, eye patterns, eye measurements, mask testing, eye mask unfolding, jitter measurements, crosstalk analysis, channel de-embedding, channel emulation, virtual probing, SSC, calculating bandwidth requirements, serial data waveform decoding, multi-lane testing, intersymbol interference, equalization, pre-emphasis and de-emphasis, DFE, FFE, CTLE equalization, transmitter and receiver measurements, SERDES testing

 


Who should attend: Who Should attend: EE’s working in Signal Integrity, SERDES, or Serial Data, Tech’s and Job seekers who want a better understanding of Serial Data Links.

Cost:  FREE, registration is required to hold your seat.

 

Presenter: Karthik Radhakrishna
Applications Engineer, Teledyne LeCroy
 

Register for the Seminar

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Debugging High Speed Serial Data Links

        
 

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