When: Weds., January 23, 2019
Time: 10:00AM - 1:00PM
Where: Teledyne LeCroy Austin Labs
800 Paloma Dr., Suite 130
Round Rock, TX 78665
If you deal with jitter this seminar is for you.
Jitter is often the ultimate reason many high speed serial links fail. Analyzing the jitter between data and a reference clock is essential to find the root cause of the problem as the first step toward fixing it. Yet many of the principles of jitter are confusing or poorly understood.
In this seminar, we start at the ground floor to describe the most important and essential principle of jitter, the origin of the time interval error and how it can be used to identify sources of jitter. We start with the basic process of how it is measured and how statistical analysis can be applied to it in order to look for patterns. In particular, four jitter patterns will be uncovered and the important figures of merit for each type will be identified.
There are only a handful of fundamental sources of jitter: periodic, DCD, ISI, random and “other”. Each of these has a different physical origin and has a different set of figures of merit by which they are described. We will explore what features in a typical high speed serial link create to each type of jitter and how to use the analysis of the TIE track to extract a few important figures of merit. We will see that depending on the properties of each type of jitter, different analysis techniques leveraging statistics, histograms and spectra apply to each type. In particular, we introduce a simplified version of Gaussian statistics to describe the figures of merit for random jitter.
In Parts 1 and 2, we introduced the five fundamental types of jitter based on their root cause. In this final part, we will explore how we measure and analyze jitter in high speed serial links.
We will look at how to take a measurement on less than a million bits and extrapolate the total jitter to a million times as many bits and when we need to find the root cause of jitter, how to decompose the total jitter into its five components.
Presenter: Karthik Radhakrishna
Cost: FREE, registration is required to hold your seat.
Register for the Seminar
Essentials of Jitter: Time Interval Error, Components of Jitter, Practical Jitter Measurements
PLEASE NOTE: All visitors must provide valid government photo identification prior to gaining access to a Teledyne facility. This can be in the form of a driver's license or passport.