When: Tues, June 11, 2019
Time: 10:00AM - 1:00 PM (Includes lunch)
Where: Teledyne LeCroy
27007 Hills Tech Court
Farmington Hills, MI 48331
In this 3-hour seminar, we will introduce measurement techniques for identifying and characterizing signal integrity problems in high speed serial data using both oscilloscopes and time domain reflectometry.
Topics include serial data analysis, signal integrity, eye patterns, eye measurements, mask testing, eye mask unfolding, jitter measurements, characterizing crosstalk, crosstalk analysis, network analysis, insertion loss, return loss, channel de-embedding, channel emulation, virtual probing, SSC, calculating bandwidth requirements, serial data waveform decoding, multi-lane testing, intersymbol interference, equalization, pre-emphasis and de-emphasis, DFE, FFE, CTLE equalization, transmitter and receiver measurements, SERDES testin
Cost: FREE, registration is required to hold your seat.
Register for the Seminar
Seminar: Identifying and Measuring Signal Integrity Problems
PLEASE NOTE: All visitors must provide valid government photo identification prior to gaining access to a Teledyne facility. This can be in the form of a driver's license or passport.