When: Tues, June 11, 2019

Time: 10:00AM - 1:00 PM (Includes lunch)

Where: Teledyne LeCroy
27007 Hills Tech Court
Farmington Hills, MI 48331

As serial data signals reach faster and faster data rates, the measurement and characterization of signal integrity problems becomes increasingly critical.
In this 3-hour seminar, we will introduce measurement techniques for identifying and characterizing signal integrity problems in high speed serial data using both oscilloscopes and time domain reflectometry.
Topics include serial data analysis, signal integrity, eye patterns, eye measurements, mask testing, eye mask unfolding, jitter measurements, characterizing crosstalk, crosstalk analysis, network analysis, insertion loss, return loss, channel de-embedding, channel emulation, virtual probing, SSC, calculating bandwidth requirements, serial data waveform decoding, multi-lane testing, intersymbol interference, equalization, pre-emphasis and de-emphasis, DFE, FFE, CTLE equalization, transmitter and receiver measurements, SERDES testin

Cost: FREE, registration is required to hold your seat.


Register for the Seminar

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Seminar: Identifying and Measuring Signal Integrity Problems


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