When: Tues, June 11, 2019

Time: 10:00AM - 1:00 PM (Includes lunch)


Where: Teledyne LeCroy
27007 Hills Tech Court
Farmington Hills, MI 48331

As serial data signals reach faster and faster data rates, the measurement and characterization of signal integrity problems becomes increasingly critical.
 
In this 3-hour seminar, we will introduce measurement techniques for identifying and characterizing signal integrity problems in high speed serial data using both oscilloscopes and time domain reflectometry.
 
Topics include serial data analysis, signal integrity, eye patterns, eye measurements, mask testing, eye mask unfolding, jitter measurements, characterizing crosstalk, crosstalk analysis, network analysis, insertion loss, return loss, channel de-embedding, channel emulation, virtual probing, SSC, calculating bandwidth requirements, serial data waveform decoding, multi-lane testing, intersymbol interference, equalization, pre-emphasis and de-emphasis, DFE, FFE, CTLE equalization, transmitter and receiver measurements, SERDES testin


Cost: FREE, registration is required to hold your seat.


 

Register for the Seminar

By ticking this box you agree to receive information from Teledyne and our authorized sales representatives and distributors about our latest news, events and products and/or services by email. Please see our privacy policy at http://www.teledyne.com/privacy-policy

Seminar: Identifying and Measuring Signal Integrity Problems


          
 

© 2019 Teledyne LeCroy

Privacy Policy | Site Map

PLEASE NOTE: All visitors must provide valid government photo identification prior to gaining access to a Teledyne facility. This can be in the form of a driver's license or passport.