When: Weds., July 17, 2019
Time: 10:00AM - 1:00PM (Including Lunch)


Where: Teledyne LeCroy
27007 Hills Tech Court
Farmington Hills, MI 48331


In this class you will learn how to characterize a high speed Interconnect DUT (like Automotive ethernet cables, harnesses interconnect) combining measurements in frequency and time domain. S-parameters de-embedding and time gating will be explained with measurements example.    

This information will help you to obtained the complete characterization of your interconnect DUT.  

  • Frequency domain :
    • Measure S-parameters
    • Convert S-parameter from Single-ended to Mixed-mode
    • Reference plane and calibration
  • Time domain:
    • Measure the Impedance profile and the impulse/step response
    • Identify the type and locate discontinuities and  impedance mismatch (spatial resolution)
    • Common mode and differential mode Impedance profile
    • S-parameter cable and adapters de-embedding
    • Time-gating (in-situ de-embedding)
    • Emulation of Eye Diagram and jitter analysis


Cost:  FREE, registration is required to hold your seat.

 

Register for the Seminar

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Seminar: High Speed Interconnect Analysis

        
 

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