De-embedding is a common problem when performing signal integrity measurements because often the interconnection between the measuring instrument and the DUT requires test fixtures, cables and probes.
We will examine the concepts of traditional frequency domain de-embedding methods and time domain methods such as time gating and peeling. We will also mention the “causality” requirement and why it is so important when using S-parameters ready for emulation. Finally “2x thru” and “delta-L” de-embedding methods will be touched upon.
In this webinar all concepts will be explained with live examples taking measurements of simple differential and single ended DUTs and discussing the results obtained
Duration: 45 minutes including Q&A session at the end.
Presenter: Giuseppe Leccia, Teledyne LeCroy
Can't attend live? Register anyway and we will send you the recording and slides afterward.
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