This webinar was originally held on September 21, 2022.
Jitter University Webinar Series
Confused about jitter? Did someone’s explanation of jitter create more questions than answers? If so, join Teledyne LeCroy as we teach everything about jitter – what jitter is, different categories, instruments used, measurements and views, deconvolution and extrapolation, and more. Click here to access the entire series.
Part 5: Fundamentals of Serial Data Jitter Measurements
In this session we focus on the details of the time interval error (TIE) measurement that is the foundation for extrapolated jitter calculations on non-return to zero (NRZ) serial data signals. We describe a typical serial data link, and provide foundational knowledge about the impact that link has on jitter measurement and extrapolation methodologies.
Topics to be covered in this webinar:
- Recap of TIE and data-sliced eye diagrams
- Introduction to serial data links and their measurement impact
- The relationship between jitter and bit error rate (BER)
- Introduction to bathtub curves
- Oscilloscopes vs. Bit Error Rate testers
- Preview of jitter separation and extrapolation
Who should attend? Any electrical engineer who is designing, validating or debugging systems with high-speed serial data links.
What attendees will learn? Attendees will learn the fundamentals of jitter deconvolution and extrapolation and how to interpret the various measured and calculated values.
Presented by: Alan Blankman, Ph.D, Senior Software Engineer