This webinar was originally held on October 6, 2022.
Become an Expert on Channel Operating Margin (COM) and Understanding Its Impact on Oscilloscope Eye Diagrams
Join Teledyne LeCroy, Siemens EDA and Professor Eric Bogatin to learn best practices to reduce artifacts when calculating the channel operating margin (COM) using an S-parameter file for a serial data link. Follow these important guidelines and you will reduce common artifacts and become an expert in using the COM specification, and in how the COM value correlates to oscilloscope eye diagrams.
Topics to be covered in this webinar:
- A simple explanation of COM
- Calculating COM from measured or simulated S-parameters
- Top three artifacts introduced from a measurement and how to avoid them
- Correlating COM value and the measured eye diagram on an oscilloscope
Who should attend? Engineers involved in interconnect, printed circuit board (PCB), and high-speed serial link design and test, or system hardware engineering, with data rates above 25 Gb/s. this webinar will introduce you to best measurement and simulation practices in your serial data link analysis.
What attendees will learn? What COM really means, what features in your serial data link affect the COM and the right ways to correlate COM value and oscilloscope eye diagrams.
Presented by: Eric Bogatin, Teledyne LeCroy Fellow and Professor, ECEE Univ of Colorado, Boulder