How to Perform Double Pulse Testing (DPT)
on GaN and SiC Devices Webinar

Double Pulse Test of a GaN or SiC power semiconductor device using a Teledyne LeCroy oscilloscope and DL-ISO isolated HV probe.


This webinar was originally held on September 6, 2023.

How to Perform Double Pulse Testing (DPT) on GaN and SiC Devices

Join Teledyne LeCroy to see Double Pulse Testing performed on gallium nitride (GaN) and silicon carbide (SiC) power semiconductor devices. Learn more about various safety measures that need to be addressed before making measurements and what to infer from the captured waveforms.

Topics to be covered in this webinar:

  • Double Pulse Test (DPT) basics
  • Test instrumentation needs
  • Safety issues and how to overcome them
  • The importance of probe deskew
  • How to calculate turn on/off delays, switching losses, etc.

Who should attend? Hardware engineers, systems engineers, production engineers, and technicians testing wide bandgap semiconductor devices

What attendees will learn? How to perform the double pulse test safely, and capture and characterize a GaN or SiC power semiconductor device’s dynamic response

Presented by: William Kaunds, Product Marketing Manager, Teledyne LeCroy

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