PCIe Gen6 Testing Challenges



PCIe Gen6 Testing Challenges

PCI Express technology is one of the most advanced computer I/O serial standards highly adopted on AI, ML, ADAS, Data Center, Cloud and other applications. It can be used as peripheral device interconnect, chip-to-chip interface and as a bridge to many other protocol standards.

Join Teledyne LeCroy and Anritsu for this fascinating webinar which will focus on technology evolution for PCIe Gen6 and related testing challenges.

Presented by:
Martin Storch (Field Application Engineer – Anritsu)
Maurizio Mastrofini (Senior Application Engineer - Teledyne LeCroy)


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