PCI Express® 7.0 Transmitter Characterization

Comparison of Simulated to Measured Results on First Silicon

PCI Express 7.0 Transmitter Characterization Webinar

AVAILABLE ON-DEMAND

This webinar was originally held on May 15, 2024.

PCI Express 7.0 Transmitter Characterization

Comparison of Simulated to Measured Results on First Silicon

In this webinar, we present results of Alphawave Semi's Input/Output Buffer Information Specification algorithmic modeling interface (IBIS-AMI) as measured by Teledyne LeCroy’s WaveMaster® 8650HD 65 GHz, 12-bit high-definition oscilloscope (HDO®) and Serial Data Analysis Expert (SDAX) software for PCIe® 7.0.

This demonstration is indicative of the types of tests that could be expected to be performed on similar 128 Gigabit per second (Gbps) DSP-based Serializer-Deserializer (SerDes) transmitting PCIe 7.0 signals.

Topics to be covered in this webinar:

  • PCIe 7.0 transmitter jitter
  • PCIe 7.0 transmitter modeling
  • PCIe 7.0 pulse response
  • PCIe 7.0 signal-to-noise-and-distortion ratio (SNDR).

Who should attend? Engineers who will be involved in designs of PCIe 7.0 serial data links.

What attendees will learn: The types of tests that may be required in PCIe 7.0 and how those tests are performed.

Presenters: 
Anthony Mickens, Product Marketing Manager, Teledyne LeCroy
Adrien Auge, Senior Signal Integrity Engineer, Alphawave  

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