PCI Express® 7.0 Transmitter Characterization

Comparison of Simulated to Measured Results on First Silicon

PCI Express 7.0 Transmitter Characterization Webinar

Date: Wednesday, May 15, 2024
Time: 11 AM Pacific | 2 PM Eastern
Duration: 60 minutes

PCI Express 7.0 Transmitter Characterization

Comparison of Simulated to Measured Results on First Silicon

In this webinar, we present results of Alphawave Semi's Input/Output Buffer Information Specification algorithmic modeling interface (IBIS-AMI) as measured by Teledyne LeCroy’s WaveMaster® 8650HD 65 GHz, 12-bit high-definition oscilloscope (HDO®) and Serial Data Analysis Expert (SDAX) software for PCIe® 7.0.

This demonstration is indicative of the types of tests that could be expected to be performed on similar 128 Gigabit per second (Gbps) DSP-based Serializer-Deserializer (SerDes) transmitting PCIe 7.0 signals.

Topics to be covered in this webinar:

  • PCIe 7.0 transmitter jitter
  • PCIe 7.0 transmitter modeling
  • PCIe 7.0 pulse response
  • PCIe 7.0 signal-to-noise-and-distortion ratio (SNDR).

Who should attend? Engineers who will be involved in designs of PCIe 7.0 serial data links.

What attendees will learn: The types of tests that may be required in PCIe 7.0 and how those tests are performed.

Presenter: 
Anthony Mickens, Product Marketing Manager, Teledyne LeCroy
 

Can't attend live? Register anyway and you will receive an email with the recording after the live event.

By ticking this box you agree to receive information from Teledyne and our authorized sales representatives and distributors about our latest news, events and products and/or services by email. Please see our privacy policy at http://www.teledyne.com/privacy-policy.