Oscilloscope Probing in Power Electronics —
What to Use and Why
Power electronics designs have inherent measurement challenges. Proper probe selection and use is critical for operator, equipment and DUT safety and also has a large influence on measurement accuracy.
In this three-part webinar series, Teledyne LeCroy will describe what high-voltage and isolated probes are best suited to each measurement. The series is ideal for any engineer probing power conversion systems with floating voltages above 12 V.
Part 1: How to Choose the Correct High Voltage Probe
Available On-Demand
Register to receive the recording.
In part 1, we discuss how to choose the correct high voltage probe, taking into consideration the application and the accuracies required, and the safety of the operator, equipment, and DUT. The difference between the “right” probe and the “wrong” probe is usually not black and white, but more of a shade of gray.
Topics to be covered in this webinar:
- Important probe specifications
- Probe architectures, types and characteristics
- Probe fit to various applications
What will attendees learn? Attendees will gain a thorough understanding of the different types of HV probes and how to choose the best probe for the specific application.
Presented by: Ken Johnson, Director of Marketing; Jon Shechter, Product Marketing Engineer; William Kaunds, Product Marketing Manager
Part 2: Real-world High Voltage Probing Comparisons - Highlighting Basic Specification and Performance Differences
Available On-Demand
Register to receive the recording.
In part 2, we use basic probe comparisons with simple measurements on lower-speed high voltage signals to draw attention to the performance degradations of probes with seemingly “normal” specifications, and describe why these performance degradations occur.
Topics to be covered in this webinar:
- Comparison of “older” and more recent vintage HV differential probes from multiple manufacturers
- “Best-in-class” equipment from 20 years ago
- Price vs. performance – you often get what you pay for
- Instrument isolated inputs versus HV isolated probes
What will attendees learn? Attendees will gain a better understanding of how to identify a measurement problem caused by a poorly performing probe or a misapplied probe.
Presented by: Ken Johnson, Director of Marketing; Jon Shechter, Product Marketing Engineer; William Kaunds, Product Marketing Manager
Part 3: Real-world High Voltage Probing Comparisons – Specialized HV Optical Probes and 60 V Common-mode Probes
Available On-Demand
Register to receive the recording.
In part 3, we’ll improve on our understanding of high voltage probing by using higher-speed signaling (consistent with GaN and SiC devices) and highlighting what can be expected from HV optical probes or other application-optimized probes. We’ll apply everything already learned in Parts 1 and 2, but add significant measurement challenges to the probes to further differentiate their performance capabilities and characteristics.
Topics to be covered in this webinar:
- HV optical probe topologies – how are they constructed?
- Performance tradeoffs of optical vs. electrical probes
- Optimized probes for 60 V common-mode applications
What will attendees learn? Attendees will gain a better understanding of how to identify a measurement problem caused by a poorly performing probe or a misapplied probe.
Presented by: Ken Johnson, Director of Marketing; Jon Shechter, Product Marketing Engineer; William Kaunds, Product Marketing Manager