AVAILABLE ON-DEMAND
This webinar was originally held on 30 October 2025.
What is De-Embedding - and Why is it Crucial for Precise HF Measurements?
In high-frequency measurement technology, accurately characterizing components and transmission paths is essential for developing reliable high-speed designs. However, real-world test setups inevitably include additional structures such as cables, connectors, and test fixtures—elements that distort the measurement results. De-embedding is the mathematical method used to remove these influences and reveal the true response of the Device Under Test (DUT).
In the first part of this webinar series, we will cover the theoretical foundations of de-embedding in the context of both time-domain and frequency-domain measurements. Using powerful instruments like the WavePulser 40iX (for broadband S-parameter and TDR/TDT measurements) and the WaveMaster 8000HD (for high-resolution time-domain analysis), we will demonstrate how to identify and quantify parasitic effects.
Topics Covered in This Webinar:
- De-Embedding
- Why is De-Embedding important?
- What is De-Embedding?
- Fundamentals of RF Measurement Technology & Signal Integrity
- Specialized De-Embedding Techniques with the WavePulser 40iX
- De-Embedding Using SDA Expert with the WaveMaster 8000HD
- Preview of Part 2
- Q&A Session
MAUI Studio / WavePulser 40iX SW
If you’d like to start working offline with an oscilloscope or a TDR tool and explore Teledyne LeCroy’s oscilloscopes and High-Speed Interconnect Analyzer using simulated signals, take advantage of our free MAUI Studio software or the WavePulser 40iX software. You can find more information and videos here: https://teledynelecroy.com/mauistudio/ or download a free of charge Software of WavePulser 40iX: Teledyne LeCroy - TDR and S-Parameters
Who should participate? Designers, test engineers, and SI/PI engineers working with complex RF structures who want to take their measurement accuracy to the next level.
What participants will learn: How time-domain and frequency-domain measurements complement each other. The role of S-parameters, reflections, and impedance profiles. How to assess signal quality using eye diagram metrics - both before and after de-embedding.
Presenter: Sven Kaiser, Field Application Engineer, Teledyne LeCroy