AVAILABLE ON-DEMAND
This webinar was originally held on 6 November 2025.
De-Embedding in Practice - Step by Step for Correct Measurements
In high-frequency measurement technology, accurately characterizing components and transmission paths is essential for developing reliable high-speed designs. However, real-world test setups inevitably include additional structures such as cables, connectors, and test fixtures—elements that distort the measurement results. De-embedding is the mathematical method used to remove these influences and reveal the true response of the Device Under Test (DUT).
The second session of the webinar series will focus on…
- Selection and characterization of calibration standards (e.g. Open, Short, Load, Thru)
- Creation and application of S-parameter files for fixtures
- Practical examples:
- Measurement and comparison of a high-speed plug
- Measurement of a high-speed cable
- Measurement of a filter (50ohm microstrip)
- Characterization of a Loss Board for PCIE Gen4
- Analysis of a SerDes signal with and without de-embedding
- USB4 cable emulation
- Test points (TP) virtually move
- PCIe Gen4 Loss emulation in compliance test
- Display port 20GBit/s cable/fixture de-embedding
- USB4 cable emulation
- Q&A Session
MAUI Studio / WavePulser 40iX SW
If you’d like to start working offline with an oscilloscope or a TDR tool and explore Teledyne LeCroy’s oscilloscopes and High-Speed Interconnect Analyzer using simulated signals, take advantage of our free MAUI Studio software or the WavePulser 40iX software. You can find more information and videos here: https://teledynelecroy.com/mauistudio/ or download a free of charge Software of WavePulser 40iX: Teledyne LeCroy - TDR and S-Parameters
Who should participate? Designers, test engineers, and SI/PI engineers working with complex RF structures who want to take their measurement accuracy to the next level.
What participants will learn: How time-domain and frequency-domain measurements complement each other. The role of S-parameters, reflections, and impedance profiles. How to assess signal quality using eye diagram metrics - both before and after de-embedding.
Presenter: Sven Kaiser, Field Application Engineer, Teledyne LeCroy