How to Integrate VNA (S-parameter) Measurements into High-Speed Serial Data Compliance Test Workflows
Date: Wednesday, December 2, 2026
Time: 11 AM Pacific | 2 PM Eastern
Duration: 60 minutes
S-parameter measurements (or VNA measurements) have become an essential component of Tx/Rx compliance testing for many high-speed serial standards including USB4, Thunderbolt, DisplayPort, PCI Express, and others. Join Teledyne LeCroy as we explain how these measurements can be more easily integrated into automated compliance test tools.
Topics to be covered in this webinar:
- De-embedding test cables
- Tx/Rx return loss measurements
- Measuring BERT intrinsic insertion loss
- Channel characterization for Rx testing
Who should attend? Validation and Test Engineers responsible for validation, compliance, and debug of high speed serial standards.
What will attendees learn? How S-parameter measurements are integrated into automated compliance testing.
Presented by: Mike Engbretson, Product Marketing Manager
Can't attend live? Register anyway and we will send you the recording afterward.