Registration is now Closed

Check out our August and September class schedule

Location: Teledyne LeCroy Automotive Technology Center
27300 Haggerty Rd, Suite F7 Farmington Hills, MI 48331

Cost: Free – Registration Required*

Join us this July as we explore the evolving landscape of in-vehicle networking and high-speed data analysis. Whether you're designing next-gen ECUs or validating complex data streams, these sessions will equip you with the tools and insights to stay ahead in the fast-moving world of automotive technology.

SEMINAR AGENDA

10:00AM - 10:30AM: Welcome, coffee and introductions
10:30AM - 12:00pm: Seminar
12:00PM - 12:30pm: Lunch/Break
12:30PM - 2:00pm: Seminar continues
2:00PM: Seminar concludes with presenter available for oscilloscope Q&A.

Presented by: Mike Hertz, Field Applications Engineering Manager, Teledyne LeCroy

In-Vehicle Networks: CAN Bus

Date: Tuesday, July 29, 2025

In this seminar we review best practices for measuring and debugging the CAN and CAN FD serial protocols with an oscilloscope, including triggering, decoding, measurements, eye diagrams, and analysis. Additional topics include optimizing the sample rate configuration for CAN decoding and physical measurements, CAN error detection, statistics and analysis of digital CAN data, and extracting and plotting embedded CAN data for pass/fail testing.

In-Vehicle Networks: Automotive Ethernet

Date: Wednesday, July 30, 2025

In this seminar we focus on debug, compliance, and physical layer testing of Automotive Ethernet including 10Base-T1S, 100Base-T1, and 1000Base-T1.

High Speed Serial Data Debug Techniques

Date: Thursday, July 31, 2025

In this seminar we will introduce measurement techniques for identifying and characterizing signal integrity problems in high speed serial data using oscilloscopes. Topics include serial data analysis, signal integrity, eye patterns, eye measurements, mask testing, eye mask unfolding, jitter measurements, characterizing crosstalk, crosstalk analysis, network analysis, insertion loss, return loss, channel de-embedding, channel emulation, virtual probing, SSC, calculating bandwidth requirements, serial data waveform decoding, multi-lane testing, intersymbol interference, equalization, pre-emphasis and de-emphasis, DFE, FFE, CTLE equalization, transmitter and receiver measurements, including PCI Express, USB, and SERDES testing.

*Please note that we cannot accommodate walk-ins. Registration is required.